ALM OTA Wrapper API
ALM OTA Wrapper API is an helper API developed in C#.net for facilitating the development of applications interacting with HPE ALM. Code for this api is available on Github. Below […]
Tag Archives: OTA C#
Find folders under test plan folder in ALM using OTA API
In this post, we will discuss how to find child folders under test plan folder in ALM Using OTA API. We will use C# for this post. For finding child […]
Renaming test plan folder using OTA API
In this post, we will discuss how to rename a test plan folder using OTA API. We will use C# for this post To rename a test plan folder we […]
Executing SQL Queries using OTA API
In this post, we will discuss how to execute queries using ALM OTA API. We will use C#.Net. To execute queries in ALM we will use the following OTA API […]
Filtering Defects using Defect ID (BG_BUG_ID) in ALM/QC
Hello Friends, In this post, we will discuss filtering ALM defect using its primary ID (BG_BUG_ID) field. Filtering Defects (Bugs) from ALM/QC using Defect ID (BG_BUG_ID) For filtering defects using defect […]
Filtering Test from Test Plan using Test ID (TS_TEST_ID) in ALM/QC
Hello Friends, In this post, we will discuss filtering ALM test using its primary ID(TS_TEST_ID) field. Filtering Tests from Test Plan using Test ID (TS_TEST_ID) For filtering tests using Test ID, […]
DOWNLOADING ATTACHMENTS FROM ALM/QC, Tests (Test plan) and Design Steps module
Hello Friends, In this post, we will discuss downloading the attachments from Test plan module of ALM/QC. Downloading attachments from test plan is little trickier then downloading attachments from requirements […]
Downloading Attachments from ALM/QC Requirements Module
Introduction HP ALM, is a tool developed by HP, for managing the quality of a software. There are several modules available in ALM, and most of them (like defects, tests […]
Downloading Attachments from ALM/QC Defect Module
Introduction HP ALM is a tool developed by HP, for managing the quality of the softwares. There are several modules available in ALM, and most of them (like defects, tests […]
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